Experimental evidence for excitonic mechanism of defect generation in high-purity silica
Phys Rev Lett
.
1991 Oct 28;67(18):2517-2520.
doi: 10.1103/PhysRevLett.67.2517.
Authors
TE Tsai
,
DL Griscom
PMID:
10044446
DOI:
10.1103/PhysRevLett.67.2517
No abstract available