A simple method for producing flattened atomic force microscopy tips

P Biagioni; J N Farahani; P Mühlschlegel; H-J Eisler; D W Pohl; B Hecht

doi:10.1063/1.2834875

A simple method for producing flattened atomic force microscopy tips

Rev Sci Instrum. 2008 Jan;79(1):016103. doi: 10.1063/1.2834875.

Authors

P Biagioni¹, J N Farahani, P Mühlschlegel, H-J Eisler, D W Pohl, B Hecht

Affiliation

¹ Nano-Optics Group, National Center of Competence for Research in Nanoscale Science, Institute of Physics, University of Basel, Klingelbergstrasse 82, CH-4056 Basel, Switzerland. paolo.biagioni@polimi.it

PMID: 18248075
DOI: 10.1063/1.2834875

Abstract

We describe a simple and reliable procedure for obtaining a flat plateau on top of standard silicon nitride atomic force microscopy tips by scanning them over the focus of a high-numerical-aperture objective illuminated by near-infrared ultrashort laser pulses. Flattened tips produced this way exhibit a plateau that is parallel to the substrate when the cantilever is mounted. They represent a valid and cost-effective alternative to commercially available plateau tips.

MeSH terms

Equipment Design / instrumentation*
Equipment Design / methods*
Equipment Failure Analysis
Microscopy, Atomic Force / instrumentation*
Microscopy, Atomic Force / methods
Nanotechnology / instrumentation*
Nanotechnology / methods
Reproducibility of Results
Sensitivity and Specificity
Transducers*