Generation of highly n-type titanium oxide using plasma fluorine insertion

Nano Lett. 2011 Feb 9;11(2):751-6. doi: 10.1021/nl1039378. Epub 2010 Dec 22.

Abstract

True n-type doping of titanium oxide without formation of midgap states would expand the use of metal oxides for charge-based devices. We demonstrate that plasma-assisted fluorine insertion passivates defect states and that fluorine acts as an n-type donor in titanium oxide. This enabled us to modify the Fermi level and transport properties of titanium oxide outside the limits of O vacancy doping. The origin of the electronic structure modification is explained by ab initio calculation.

Publication types

  • Research Support, U.S. Gov't, Non-P.H.S.

MeSH terms

  • Computer Simulation
  • Crystallization / methods*
  • Fluorine / chemistry*
  • Gases / chemistry
  • Hot Temperature
  • Macromolecular Substances / chemistry
  • Materials Testing
  • Models, Chemical*
  • Molecular Conformation
  • Nanostructures / chemistry*
  • Nanostructures / ultrastructure*
  • Nanotechnology / methods*
  • Particle Size
  • Semiconductors
  • Surface Properties
  • Titanium / chemistry*

Substances

  • Gases
  • Macromolecular Substances
  • titanium dioxide
  • Fluorine
  • Titanium