Calibration of imaging plates to electrons between 40 and 180 MeV

N Rabhi; K Bohacek; D Batani; G Boutoux; J-E Ducret; E Guillaume; K Jakubowska; C Thaury; I Thfoin

doi:10.1063/1.4950860

Calibration of imaging plates to electrons between 40 and 180 MeV

Rev Sci Instrum. 2016 May;87(5):053306. doi: 10.1063/1.4950860.

Authors

N Rabhi¹, K Bohacek², D Batani¹, G Boutoux¹, J-E Ducret¹, E Guillaume³, K Jakubowska⁴, C Thaury³, I Thfoin⁵

Affiliations

¹ CELIA (Centre Lasers Intenses et Applications), Université Bordeaux, CNRS, CEA, UMR 5107, F-33405 Talence, France.
² ELI Beamlines, Institute of Physics ASCR, Prague, Czech Republic.
³ LOA, ENSTA ParisTech, École Polytechnique, Université Paris-Saclay, CNRS, 91762 Palaiseau, France.
⁴ Institute of Plasma Physics and Laser Microfusion, Hery Street 23, 01-497 Warsaw, Poland.
⁵ CEA DAM DIF, F-91297 Arpajon, France.

PMID: 27250413
DOI: 10.1063/1.4950860

Abstract

This paper presents the response calibration of Imaging Plates (IPs) for electrons in the 40-180 MeV range using laser-accelerated electrons at Laboratoire d'Optique Appliquée (LOA), Palaiseau, France. In the calibration process, the energy spectrum and charge of electron beams are measured by an independent system composed of a magnetic spectrometer and a Lanex scintillator screen used as a calibrated reference detector. It is possible to insert IPs of different types or stacks of IPs in this spectrometer in order to detect dispersed electrons simultaneously. The response values are inferred from the signal on the IPs, due to an appropriate charge calibration of the reference detector. The effect of thin layers of tungsten in front and/or behind IPs is studied in detail. GEANT4 simulations are used in order to analyze our measurements.

Publication types

Research Support, Non-U.S. Gov't