Probing liquid surfaces under vacuum using SEM and ToF-SIMS

Lab Chip. 2011 Aug 7;11(15):2481-4. doi: 10.1039/c0lc00676a. Epub 2011 Jun 14.

Abstract

We report a newly developed self-contained interface for high-vapor pressure liquid surfaces to vacuum-based analytical instruments. It requires no wires or tubing connections to the outside of the instrument and uses a microfluidic channel with a 3 μm diameter window into the flowing fluid beneath it. This window supports the liquid against the vacuum by the liquid's surface tension and limits the high-density vapor region traversed by the probe beams to only a few microns. We demonstrate this microfluidic interface for in situ liquid surfaces in a time-of-flight secondary ion mass spectrometer (ToF-SIMS) and a scanning electron microscope (SEM) with chemical analysis.

Publication types

  • Research Support, U.S. Gov't, Non-P.H.S.

MeSH terms

  • Microfluidic Analytical Techniques*
  • Microscopy, Electron, Scanning / instrumentation
  • Microscopy, Electron, Scanning / methods
  • Spectrometry, Mass, Secondary Ion / instrumentation
  • Spectrometry, Mass, Secondary Ion / methods*
  • Vacuum*