Editorial: Measurement Invariance

Rens Van De Schoot; Peter Schmidt; Alain De Beuckelaer; Kimberley Lek; Marielle Zondervan-Zwijnenburg

doi:10.3389/fpsyg.2015.01064

Editorial: Measurement Invariance

Front Psychol. 2015 Jul 28:6:1064. doi: 10.3389/fpsyg.2015.01064. eCollection 2015.

Authors

Rens Van De Schoot¹, Peter Schmidt², Alain De Beuckelaer³, Kimberley Lek⁴, Marielle Zondervan-Zwijnenburg⁴

Affiliations

¹ Department of Methods and Statistics, Utrecht University Utrecht, Netherlands ; Optentia Research Program, Faculty of Humanities, North-West University Vanderbijlpark, South Africa.
² Department of Political Sciences, University of Giessen Giessen, Germany ; International Laboratory of Social-Cultural Research, Research University Higher School of Economics Moscow, Russia.
³ Nijmegen School of Management, Institute for Management Research, Radboud University Nijmegen Nijmegen, Netherlands ; School of Sociology and Population Studies, Renmin University of China Beijing, China ; Department of Personnel Management and Work and Organizational Psychology, Ghent University Ghent, Belgium.
⁴ Department of Methods and Statistics, Utrecht University Utrecht, Netherlands.

No abstract available

Keywords: Bayesian models; approximate measurement invariance; confirmatory factor analysis; measurement invariance; partial measurement invariance; questionnaires.