Towards phasing using high X-ray intensity

IUCrJ. 2015 Sep 30;2(Pt 6):627-34. doi: 10.1107/S2052252515014049. eCollection 2015 Nov 1.

Abstract

X-ray free-electron lasers (XFELs) show great promise for macromolecular structure determination from sub-micrometre-sized crystals, using the emerging method of serial femtosecond crystallography. The extreme brightness of the XFEL radiation can multiply ionize most, if not all, atoms in a protein, causing their scattering factors to change during the pulse, with a preferential 'bleaching' of heavy atoms. This paper investigates the effects of electronic damage on experimental data collected from a Gd derivative of lysozyme microcrystals at different X-ray intensities, and the degree of ionization of Gd atoms is quantified from phased difference Fourier maps. A pattern sorting scheme is proposed to maximize the ionization contrast and the way in which the local electronic damage can be used for a new experimental phasing method is discussed.

Keywords: X-ray free-electron lasers; electronic damage; high XFEL doses; high-intensity phasing; radiation damage; serial femtosecond crystallography.